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30th Annual EOS/ESD Symposium |
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2008/09/07-2008/09/12
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Tucson, AZ | |
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The ESD Association’s annual Symposium, the International Technical Forum on electrical overstress (EOS) and electrostatic discharge (ESD), takes place at the Westin La Paloma Resort, in Tucson, AZ, on September 7-12, 2008.
The EOS/ESD Symposium consists of tutorials, technical sessions, workshops, and exhibits that are dedicated to ESD education, training, networking, and solutions. For individuals interested in professional certification and general education, there will be 29 tutorials that present a broad range of topics. The topics include ESD basics for program manager, ESD on-chip protection in advanced and RF technologies, air ionization, EOS/ESD failure models and mechanisms, in-plant ESD survey and evaluation measurements, CDM design and characterization, and more. Also offered is the two-day S20.20 seminar on developing and implementing an ESD control program.
The technical sessions include over 40 papers by authors from around the world. They will address issues such as Device Testing, ESD-RF Design Considerations, Factory/Materials, System Level Testing, and other ESD related topics.
This year’s Symposium offers 10 interactive workshops that promote discussion and the exchange of ideas. Some of the workshop session topics for this year include: ESD Control and Design for Extremely Sensitive (Class0) Devices, ESD Protection Targets, Automated Equipment and Grounding Issues, Protecting High Frequency Circuits and much more.
Attendees can further the information gained at Symposium by taking advantage of the Authors’ Corners, which provide access to technical paper authors for discussion with the largest collection of individuals who work in the fields of EOS and ESD management to be found anywhere.
Many of the tutorials earn credit for one of the professional certification programs sponsored by the ESD Association: ESD Certified Professional-Device/Design and ESD Certified Professional-Program Manager.
The ESD Certified Professional – Device Design exam and The ESD Certified Professional-Program Manager exam will be offered on September 12. Both exams are open to individuals who meet the certification requirements, including prior registration with association headquarters. The association has also extended an offer to certified NARTE engineers who wish to earn Program Manager Certification; details of this offer can be found by visiting www.esda.org/certification.html or by contacting the association.
A large collection of Exhibitors from around the world will present products, solutions, services, and publications serving professionals in the EOS and ESD fields. Exhibits are open to the public and do not require symposium registration.
Other events include the Welcome Reception, Awards Breakfast, Professional and Technical Women’s Reception, Attendee Lunch, and the ESD Association Annual Meeting and Luncheon. During the Awards Breakfast there will be a fun look at the 30 year history of symposium.
The EOS/ESD Symposium is sponsored by the ESD Association in cooperation with the IEEE. It is technically co-sponsored by the Electron Devices Society. The general chair is Gianluca Boselli, Texas Instruments; the vice general chair is Steven Voldman, Steven H. Voldman LLC.; and the technical program chair is Vesselin Vassilev, Texas Instruments.
The ESD Association offers discounts for association members, students, and early registration. The deadline for early registration is July 25.
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